When comparing McXtrace and the ssrl glitch database, glitches are found at the same positions for the same crystals and orientations.
Work still needs to be done to get the same intensity deviation with McXtrace compared to the ssrl glitch database. To do so the improvements listed in [questions and improvements](questions) will be implemented, mainly the creation of an ssrl beamline ([see version 2](v2)).
Work still needs to be done to get the same intensity deviation with McXtrace compared to the ssrl glitch database. To do so the improvements listed in [questions and improvements](questions) will be implemented, mainly the creation of an ssrl beamline ([see version 2](glitches/v2)).
Simulations done in this first version might also be re-run with some of the improvements listed (correct Si.lau file, correct crystal orientations etc ...)
For the end user's ease of use, another objective is to run all the logic from a python package. [McStasScript](https://github.com/PaNOSC-ViNYL/McStasScript) would be used to abstract away McXtrace. Of course the native McXtrace way to run the logic would also still be a possibility.
